nomarski interference
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Gideon Analytical Laboratories, Inc.
Gideon Labs: Leaders in Component Failure Analysis, Failure Analysis and Analytical Techniques
Gideon provides root cause analysis using chemical, construction, materials and failure analysis on electronic components, PCBs, and semiconductors. We have performed failure analysis with scanning electron microscope, radiography, gas chromatography, gc, spectroscopy and other analytical techniques. We have electrically tested PWB and components using specifications to get to the root cause of the failure.
power supply, relays, semiconductors, capacitors, reverse engineering, environmental testing, esd, failure analysis, electronic components, resistors, leds, microscopes, printed circuit boards, chemical analysis, non-destructive testing, rectifiers, diodes, electrical testing, mil-spec, microscopy, pwb, scr, organic analysis, spectroscopy, metal analysis, thermal shock, elemental analysis, root cause analysis, voids, construction analysis, cross section, destructive physical analysis, dpa, fa, mosfets, pwbs, surface analysis, bond pull, chemical deprocessing, component failure analysis, component qualification, curve trace, debug processes, design verification test, die shear, electrical characterization, electrical failures, electrical over stress, electrical verification, electromigration, electron spectroscopy for material analysis, electrostatic discharge, fein focus x-ray, glass oxide, glass transistion, hermetic seal testing, intermetallic, lead pull, liquid crystal, metal hillocks, nomarski interference, optical microscopy, pcb electrical testing, plastic encapsulated microcircuits, polarized light, probe station, process evaluation, qualification plans, reliabilitiy testing, residual gas analysis, scanning electron microscope, schottky diodes, sem-eds, sem-edx, silicon controlled rectifiers, silver migration, solder analysis, solder failures, solder joints, solder wetting, test methods, thermal cycle, voltage contrast, x-ray microanalysis
